Title: Amorphous Si TFTs on plastically deformed spherical domes Author(s): HSU, P.I.; GLESKOVA, H.; HUANG, M.; et al. Source: Journal of Non-Crystalline Solids Volume: 299-302 Pages: 1355-1359 Pub Year: 2002
added
28-Jul-08
2.
Title: An arterial performance index Author(s): HUANG, M.; FENG, J.; HUANG, Y.T. Source: Chinese Journal of Biomedical Engineering (English Edition) Volume: 7 Issue: 1 Pages: 31-36 Pub Year: 1998
added
28-Jul-08
3.
Title: An investigation of contact deformation, fracture, and fatigue behavior in bulk metallic glasses Author(s): MERCER, C.; ANGLIN, P.T.; CIRINCIONE, R.; et al. Source: Metallurgical and Materials Transactions A-Physical Metallurgy and Materials Science Volume: 34A Issue: 9 Pages: 1851-1861 Pub Year: 2003
added
28-Jul-08
4.
Title: Analytical solutions for thermal stresses in buried channel waveguides Author(s): HUANG, M. Source: IEEE Journal of Quantum Electronics Volume: 40 Issue: 11 Pages: 1562-1568 Pub Year: 2005
added
28-Jul-08
5.
Title: Analytical solutions to estimate stress induced polarization shift and the temperature sensitivity of optical waveguides Author(s): HUANG, M.; YAN, X. Source: Journal of Applied Physics Volume: 95 Issue: 5 Pages: 2820-2826 Pub Year: 2004
added
28-Jul-08
6.
Title: Bioinspired design of dental multilayers Author(s): HUANG, M.; WANG, R.; THOMPSON,V.P.; et al. Source: Journal of Materials Science-Materials in Medicine Volume: 18 Pages: 57-64 Pub Year: 2007
added
28-Jul-08
7.
Title: Contact damage of dental multilayers: viscous deformation and fatigue mechanisms Author(s): HUANG,M.; NIU, X.; SHROTRIYA, P.; et al. Source: Journal of Engineering Materials and Technology-Transactions of the ASME Volume: 127 Pages: 33-39 Pub Year: 2005
added
28-Jul-08
8.
Title: Creep induced rate effects on radial cracks in multilayered structures Author(s): HUANG, M.; NIU, X.; SOBOYEJO,W.O. Source: Journal of Materials Science-Materials in Medicine Volume: 18 Issue: 1 Pages: 65-69 Pub Year: 2007
added
28-Jul-08
9.
Title: Effects of mechanical strain on TFTs on spherical domes Author(s): HSU, P.I.; HUANG, M.; GLESKOVA, H.; et al. Source: IEEE Transactions on Electron Devices Volume: 51 Issue: 3 Pages: 371-377 Pub Year: 2004
added
28-Jul-08
10.
Title: Exploring transistor width effect on stress-induced performance improvement in PMOSFET with SiGe source/drain Conference Name: International Conference on Simulation of Semiconductor Processes and Devices Author(s): WANG, X.; HUANG, M.; BOWEN, C.; et al. Pages: 323-326 Year of conference: 2005
