Title: MIXED-MODE CRACKING IN LAYERED MATERIALS Author(s): HUTCHINSON, JW; SUO, Z Source: ADVANCES IN APPLIED MECHANICS, VOL 29 Volume: 29 Pages: 63-191 Published: 1992 Times Cited: 1112
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2.
Title: FRACTURE-MECHANICS FOR PIEZOELECTRIC CERAMICS Author(s): SUO, Z; KUO, CM; BARNETT, DM; et al. Source: JOURNAL OF THE MECHANICS AND PHYSICS OF SOLIDS Volume: 40 Issue: 4 Pages: 739-765 Published: MAY 1992 Times Cited: 628
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3.
Title: SINGULARITIES, INTERFACES AND CRACKS IN DISSIMILAR ANISOTROPIC MEDIA Author(s): SUO, ZG Source: PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES Volume: 427 Issue: 1873 Pages: 331-358 Published: FEB 8 1990 Times Cited: 374
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4.
Title: INTERFACE CRACK BETWEEN 2 ELASTIC LAYERS Author(s): SUO, ZG; HUTCHINSON, JW Source: INTERNATIONAL JOURNAL OF FRACTURE Volume: 43 Issue: 1 Pages: 1-18 Published: MAY 1990 Times Cited: 329
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5.
Title: SANDWICH TEST SPECIMENS FOR MEASURING INTERFACE CRACK TOUGHNESS Author(s): SUO, ZG; HUTCHINSON, JW Source: MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING Volume: 107 Pages: 135-143 Published: JAN 1989 Times Cited: 255
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6.
Title: EXPERIMENTAL-DETERMINATION OF INTERFACIAL TOUGHNESS CURVES USING BRAZIL-NUT-SANDWICHES Author(s): WANG, JS; SUO, Z Source: ACTA METALLURGICA ET MATERIALIA Volume: 38 Issue: 7 Pages: 1279-1290 Published: JUL 1990 Times Cited: 197
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7.
Title: The effect of stress on the dielectric properties of barium strontium titanate thin films Author(s): SHAW, TM; SUO, Z; HUANG, M; et al. Source: APPLIED PHYSICS LETTERS Volume: 75 Issue: 14 Pages: 2129-2131 Published: OCT 4 1999 Times Cited: 162
Title: MODELS FOR BREAKDOWN-RESISTANT DIELECTRIC AND FERROELECTRIC CERAMICS Author(s): SUO, Z Source: JOURNAL OF THE MECHANICS AND PHYSICS OF SOLIDS Volume: 41 Issue: 7 Pages: 1155-1176 Published: JUL 1993 Times Cited: 116
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10.
Title: ELASTIC ENERGY-RELEASE DUE TO DOMAIN FORMATION IN THE STRAINED EPITAXY OF FERROELECTRIC AND FERROELASTIC FILMS Author(s): POMPE, W; GONG, X; SUO, Z; et al. Source: JOURNAL OF APPLIED PHYSICS Volume: 74 Issue: 10 Pages: 6012-6019 Published: NOV 15 1993 Times Cited: 113
